Kazunori Kurishima

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 9:00 AM - 12:15 PM 502 (502)

Oral presentation
| 21 Joint Session K
| 21.1 Joint Session K

[16a-502-1~12] 21.1 Joint Session K

10:15 AM - 10:30 AM

△ [16a-502-6] Influence of hole trapping on transistor characteristics for C-doped In-Si-O

〇(D)Kazunori Kurishima^1,2, Toshihide Nabatame², Takio Kizu², Kazuhito Tsukagishi², Akihiko Ohi², Naoki Ikeda², Toyohiro Chikyow², Atsushi Ogura¹ (1.Meiji Univ., 2.NIMS)

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