Mari Yamshita

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 9:30 AM - 11:30 AM P5 (BP)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[16a-P5-1~15] 15.6 Group IV Compound Semiconductors (SiC)

9:30 AM - 11:30 AM

[16a-P5-15] Integrated Degradation Analysis for SiC Die Attachment Systems subjected to Thermal Cycle Test

〇Mari Yamshita¹, Tatsuhiro Suzuki¹, Sawa Araki¹, Tetsuya Mori¹, Takashi Ogihara², Hidekazu Tanaka², Hisashi Yakumaru³, Satoshi Tanimoto¹ (1.NISSAN ARC, Ltd, 2.Tektronix/Keithley Japan, 3.Hitachi Power Solutions)

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