Xiaoyu Tang

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 2:00 PM - 5:00 PM 413 (413)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[16p-413-1~11] 13.3 Insulator technology

6.1と13.3と13.5のコードシェアセッションあり

3:00 PM - 3:15 PM

▼ [16p-413-5] Relationship between initial properties and reliability of Ge gate stacks

〇(D)Xiaoyu Tang^1,2, Akira Toriumi¹ (1.Univ. of Tokyo, 2.Nanjing Univ.)