Yoshiaki Hattori

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 1:45 PM - 6:00 PM F203 (F203)

Oral presentation
| 17 Nanocarbon Technology
| 17.3 Layered materials

[16p-F203-1~15] 17.3 Layered materials

5:00 PM - 5:15 PM

[16p-F203-12] Random telegraph signal in the time-dependent dielectric breakdown test for h-BN

〇Yoshiaki Hattori¹, Takashi Taniguchi², Kenji Watanabe², Kosuke Nagashio^1,3 (1.Tokyo Univ., 2.NIMS, 3.PRESTO-JST)