Yuji Yamagishi

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Speaker, Author, Co-Author

Fri. Mar 17, 2017 9:00 AM - 12:15 PM 301 (301)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[17a-301-1~12] 15.6 Group IV Compound Semiconductors (SiC)

9:15 AM - 9:30 AM

[17a-301-2] Evaluation of Inhomogeneity of SiO₂/4H-SiC Interface by Conductive Atomic Force Microscopy and Scanning Nonlinear Dielectric Microscopy

〇Yuji Yamagishi¹, Norimichi Chinone¹, Yasuo Cho¹ (1.Res. Inst. of Electrical Commun., Tohoku Univ.)