[14a-213-1~12] 6.4 Thin films and New materials

[14a-213-4] The interference among the multi-reflected SH light beams generated by monolayer transition metal dichalcogenides on a SiO₂/Si(001) substrate

Yuhei Kikuchi¹, 〇Yoshihiro Miyauchi², Ryo Morishita¹, Masatoshi Tanaka¹, Shinya Ohno¹, Takanori Suzuki^2,1 (1.Yokohama Nat. Univ., 2.Nat. Def. Acad.)

Keywords:monolayer transition metal dichalcogenides, optical second harmonic generation

We measured the optical second harmonic generation (SHG) intensity from monolayer transition metal dichalcogenides on a 90 nm- or 270 nm-thick SiO₂/Si(001) substrate as a function of incident wavelength. The SHG spectra were found to depend strongly on the oxide thickness of the substrate, which have been interpreted by the interference among the multi-reflected SH light beams in the system.