Quantitative Sensing of the Internal Electric-field in Power Devices Using NV Centers

Takayuki Iwasaki; Wataru Naruki; Kosuke Tahara; Renato Amici; Toshiharu Makino; Hiromitsu Kato; Masahiko Ogura; Daisuke Takeuchi; Satoshi Yamasaki; Mutsuko Hatano

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[14p-412-1~18] 6.2 Carbon-based thin films

Tue. Mar 14, 2017 1:15 PM - 6:15 PM 412 (412)

Hiroshi Kawarada(Waseda Univ.), Hitoshi Umezawa(AIST), Mariko Suzuki(Toshiba)

1:15 PM - 1:30 PM

[14p-412-1] Quantitative Sensing of the Internal Electric-field in Power Devices Using NV Centers

〇Takayuki Iwasaki^1,2, Wataru Naruki¹, Kosuke Tahara^1,2, Renato Amici¹, Toshiharu Makino^2,3, Hiromitsu Kato^2,3, Masahiko Ogura^2,3, Daisuke Takeuchi^2,3, Satoshi Yamasaki^2,3, Mutsuko Hatano^1,2 (1.Tokyo Tech, 2.CREST, 3.AIST)

Keywords:Electric field sensing, Power device, NV center

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