The 64th JSAP Spring Meeting, 2017

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6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[14p-412-1~18] 6.2 Carbon-based thin films

Tue. Mar 14, 2017 1:15 PM - 6:15 PM 412 (412)

Hiroshi Kawarada(Waseda Univ.), Hitoshi Umezawa(AIST), Mariko Suzuki(Toshiba)

1:30 PM - 1:45 PM

▲ [14p-412-2] In-Situ Temperature Measurement of Diamond Devices using NV Centers

〇Renato Goes Amici1, Takayuki Iwasaki1,2, Toshiharu Makino2,3, Hiromitsu Kato2,3, Masahiko Ogura2,3, Daisuke Takeuchi2,3, Satoshi Yamasaki2,3, Mutsuko Hatano1,2 (1.Tokyo Institute of Technolgy, 2.CREST, 3.AIST)

Keywords:Temperature Measurement, Diamond Device, NV Center