1:30 PM - 1:45 PM
[14p-414-2] Advantage and Characteristic of the Heterodyne-technique in PiFM
Keywords:Scanning probe microscopy, Atomic force microscopy, Photoinduced force microscopy
Presentation information
Oral presentation
6 Thin Films and Surfaces » 6.6 Probe Microscopy
[14p-414-1~17] 6.6 Probe Microscopy
6.6と12.2のコードシェアセッションあり
Tue. Mar 14, 2017 1:15 PM - 5:45 PM 414 (414)
Yoshiaki Sugimoto(Univ. of Tokyo), Osamu Kubo(Osaka Univ.)