The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14p-414-1~17] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Tue. Mar 14, 2017 1:15 PM - 5:45 PM 414 (414)

Yoshiaki Sugimoto(Univ. of Tokyo), Osamu Kubo(Osaka Univ.)

1:45 PM - 2:00 PM

[14p-414-3] An experimental study on polarization charge density measurement of GaN by noncontact scanning nonlinear dielectric potentiometry

Kohei Yamasue1, Yasuo Cho1 (1.Tohoku Univ.)

Keywords:scanning nonlinear dielectric microscopy, scanning nonlinear dielectric potentiometry, spontaneous polarization

Scanning nonlinear dielectric potentiometry can be used for the measurement of polarization charge density. In this report, we discuss the measurment of spontaneous polarization on GaN.