Evaluation of BEEM spatial resolution by using GaAs/AlAs heterostructure

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Tue. Mar 14, 2017 1:15 PM - 5:45 PM 414 (414)

Yoshiaki Sugimoto(Univ. of Tokyo), Osamu Kubo(Osaka Univ.)

2:30 PM - 2:45 PM

〇Kenta Imamiya¹, Shigeru Kaku¹, Tatsuhito Ando¹, Junji Yoshino¹ (1.Tokyo Tech)

Keywords:Ballistic Electron Emission Microscopy