NC-AFM study of a SrTiO3(100)-(√13×√13)-R33.7o reconstructed surface

Ryota Shimizu; Yoshiaki Sugimoto; Kazuto Akagi; Masayuki Abe; Seizo Morita; Taro Hitosugi

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[14p-419-1~16] 6.3 Oxide electronics

Tue. Mar 14, 2017 1:30 PM - 6:00 PM 419 (419)

Atsushi Fukuchi(北大), Yusuke Kozuka(東大)

2:15 PM - 2:30 PM

△ [14p-419-3] NC-AFM study of a SrTiO₃(100)-(√13×√13)-R33.7^o reconstructed surface

〇Ryota Shimizu¹, Yoshiaki Sugimoto², Kazuto Akagi³, Masayuki Abe⁴, Seizo Morita⁵, Taro Hitosugi^1,3 (1.Tokyo Tech., 2.Univ. of Tokyo, 3.Tohoku Univ., 4.Osaka Univ., 5.ISIR)

Keywords:oxide electronics, strontium titanate, scanning probe microscopy

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Presentation information

[14p-419-1~16] 6.3 Oxide electronics

△ [14p-419-3] NC-AFM study of a SrTiO3(100)-(√13×√13)-R33.7o reconstructed surface

△ [14p-419-3] NC-AFM study of a SrTiO₃(100)-(√13×√13)-R33.7^o reconstructed surface