The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[14p-F201-1~14] 15.7 Crystal evaluation, impurities and crystal defects

Tue. Mar 14, 2017 1:45 PM - 5:30 PM F201 (F201)

Koji Sueoka(Okayama Pref. Univ.), Satoshi Nakano(Kyushu Univ.)

5:15 PM - 5:30 PM

[14p-F201-14] Sensitivity and detection limit of carbon concentration measurement in silicon crystal
(2) Incorrect Detection limit

Naohisa Inoue1 (1.Research integrity study Group)

Keywords:silicon crystal, carbon concentration measurement, infrared absorption

“Detection limit” of carbon concentration by infrared absorption spectroscopy is incorrectly used by the researchers of other techniques. It is around 1E+15cm-3 which is far from the research reorts down to 1E+14cm-3. “Detection limit” of SIMS and CPAA is also stated.