Influence of dimensions on Seebeck coefficient in nanostructured SOI layer

Tsuyoshi Aramaki; Yuhei Suzuki; Yoshinari Kamakura; Takanobu Watanabe; Hiroya Ikeda

Presentation information

Oral presentation

22 Joint Session M » 22.1 Joint Session M

[14p-F206-1~13] 22.1 Joint Session M

Tue. Mar 14, 2017 2:00 PM - 5:45 PM F206 (F206)

Yuji Awano(Keio Univ.), Toshio Baba(JST), Koji Miyazaki(Kyutech)

5:00 PM - 5:15 PM

[14p-F206-11] Influence of dimensions on Seebeck coefficient in nanostructured SOI layer

〇(M1C)Tsuyoshi Aramaki¹, Yuhei Suzuki¹, Yoshinari Kamakura², Takanobu Watanabe³, Hiroya Ikeda¹ (1.Shizuoka Univ., 2.Osaka Univ., 3.Waseda Univ.)

Keywords:Seebeck coefficient

We fabricated Si nanowire array on B-doped SOI substrate with widthes of 100 nm-5 µm. It was found that their Seebeck coefficient increases with increasing the wire width in contrast to our expectation. The physical reason is now under consideration.