Development of Humidity Control System Using Compressed Dry Air for Atomic Force Microscopy

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Wed. Mar 15, 2017 9:30 AM - 11:45 AM 303 (303)

10:15 AM - 10:30 AM

〇Fumiya Komatsu¹, Mariko Toyoda¹, Kazuki Miyata¹, Takeshi Fukuma^1,2 (1.Kanazawa Univ., 2.ACT-C/JST)

Keywords:atomic force microscopy, humidity control