The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

CS Code-sharing session » CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

[15a-318-1~11] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

Wed. Mar 15, 2017 9:00 AM - 12:00 PM 318 (318)

Takeshi Higashiguchi(Utsunomiya Univ.), Takeo Ejima(Tohoku Univ.)

11:30 AM - 11:45 AM

[15a-318-10] High-Diffraction-Efficiency Wide-Acceptance-Angle Laminar-Type Diffraction Gratings for Boron -K Emission Spectroscopic Measurements

Masato Koike1, Alexander Pirozhkov1, Tadashi Hatano2, Nishihara Hiroaki3, Sasai Hiroyuki3, Nagano Tetsuya3 (1.QuBS, National Inst.for Quantum and Radiological Sci. and Tech., 2.IMRM, Tohoku Univ., 3.Device Dept., Shimadzu Corp.)

Keywords:soft X-ray, diffraction grating, multilayer

In the development of steel materials such as super-high-tensile steel and the development of new medical technologies such as BNCT, accurate measurement of boron (B) at several ppm level and further clarification of interaction with other elements are also required. Recently, the authors found that diffraction efficiency can be improved by adding a thin film such as DLC to the metal surface on soft X - ray diffraction grating used for B - K emission spectroscopy. In this report, we also show that using the La type film increases the diffraction efficiency and increases the received light flux.