[15a-318-1~11] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

▲ [15a-318-9] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – IV

〇Shivaji Bachche¹, Masahiro Nonoguchi², Koichi Kato², Masashi Kageyama², Takafumi Koike², Masaru Kuribayashi², Atsushi Momose¹ (1.Tohoku Univ., 2.Rigaku Corp.)

Keywords:X-ray phase scanner, Talbot-Lau interferometry, Non-destructive testing

The X-ray Talbot and Talbot-Lau interferometers which are composed of transmission gratings and measure the differential X-ray phase shifts and scattering by objects have gained popularity because they operate with conventional X-ray generators in hospitals and factories. Recently, we have reported successful demonstration of application of X-ray Talbot-Lau interferometer scanning setup to non-destructive testing for industrial production. In this demonstration, a phase scanner apparatus consisting of three transmission gratings, a laboratory-based X-ray source that emits X-rays vertically, and an image detector on the top has been developed for the application of X-ray phase imaging with which continuously moving objects across the field of view as that of belt-conveyor system can be imaged.
Presently, we have upgraded the apparatus with imaging detector and gratings. A new imaging detector which has improved energy sensitivity suitable for high-energy X-rays used for non-destructive testing would allow us to increase the sample scanning speed while the new high-aspect-ratio gratings enable the use of higher energy X-rays. The imaging performance and evaluation of upgraded apparatus in terms of sample scanning speed and spatial resolution will be reported.