[15a-318-1~11] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

[15a-318-5] Elemental imaging using X-ray differential phase-contrast microscope

〇Norio Watanabe¹, Sadao Aoki^2,1 (1.Univ. Tsukuba, 2.CROSS)

Keywords:Phase, microscope

An X-ray differential phase-contrast microscope using Foucault knife edge was constructed at Photon Factory BL3C. The effective atomic number image of an aluminum wire was calculated from the phase image and absorption image of the aluminum wire at 4.95 keV, and it was possible to obtain a value delta/2beta relatively close to the value calculated from Henke's table.