11:15 AM - 11:30 AM
▲ [15a-318-9] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – IV
Keywords:X-ray phase scanner, Talbot-Lau interferometry, Non-destructive testing
The X-ray Talbot and Talbot-Lau interferometers which are composed of transmission gratings and measure the differential X-ray phase shifts and scattering by objects have gained popularity because they operate with conventional X-ray generators in hospitals and factories. Recently, we have reported successful demonstration of application of X-ray Talbot-Lau interferometer scanning setup to non-destructive testing for industrial production. In this demonstration, a phase scanner apparatus consisting of three transmission gratings, a laboratory-based X-ray source that emits X-rays vertically, and an image detector on the top has been developed for the application of X-ray phase imaging with which continuously moving objects across the field of view as that of belt-conveyor system can be imaged.
Presently, we have upgraded the apparatus with imaging detector and gratings. A new imaging detector which has improved energy sensitivity suitable for high-energy X-rays used for non-destructive testing would allow us to increase the sample scanning speed while the new high-aspect-ratio gratings enable the use of higher energy X-rays. The imaging performance and evaluation of upgraded apparatus in terms of sample scanning speed and spatial resolution will be reported.
Presently, we have upgraded the apparatus with imaging detector and gratings. A new imaging detector which has improved energy sensitivity suitable for high-energy X-rays used for non-destructive testing would allow us to increase the sample scanning speed while the new high-aspect-ratio gratings enable the use of higher energy X-rays. The imaging performance and evaluation of upgraded apparatus in terms of sample scanning speed and spatial resolution will be reported.