The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[15p-F204-1~19] 15.6 Group IV Compound Semiconductors (SiC)

Wed. Mar 15, 2017 1:30 PM - 7:00 PM F204 (F204)

Takahiro Makino(QST), Masashi Kato(NITech)

4:15 PM - 4:30 PM

[15p-F204-10] Measurements of carrier distribution in SiC PiN diodes by using optical transmission

Masashi Kato1, Shin-ichi Mae1, Yoshiyuki Yonezawa2, Tomohisa Kato2 (1.NITech, 2.AIST)

Keywords:silicon carbide, PIN diode, carrier distribution

We measured carrier distribution in SiC PIN diodes with off- or on-state by using optical transmission of laser light with cross sectional scan.