The 64th JSAP Spring Meeting, 2017

Presentation information

Print

Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[15p-P13-1~11] 13.2 Exploratory Materials, Physical Properties, Devices

Wed. Mar 15, 2017 4:00 PM - 6:00 PM P13 (BP)

4:00 PM - 6:00 PM

[15p-P13-5] IR absorption measurement of Mg2Si and evaluation of free electron density

〇Fuko Yaguchi1, Kohei Nakano1, Haruhiko Udono1 (1.Ibaraki Univ.)

Keywords:Mg2Si, semiconductor, IR absorption