[15p-P15-1~17] 13.5 Semiconductor devices and related technologies

[15p-P15-13] Evaluation of endurance depending on programming voltage
for non-volatile memory device using carbon nanotubes

〇Takashi Inose¹, Tomoko Ogura Iwasaki¹, Sheyang Ning², Darlene Viviani², Monte Manning², X. M. Henry Huang², Thomas Rueckes², Ken Takeuchi¹ (1.Chuo Univ., 2.Nantero.Inc)

Keywords:Carbon nanotube, endurance