1:30 PM - 3:30 PM
[15p-P8-2] First principles calculation of combined impact of dopant and plane stress on formation of intrinsic point defects in single crystal silicon
Keywords:Single crystal Si, Point defect, Thermal stress
Poster presentation
15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects
Wed. Mar 15, 2017 1:30 PM - 3:30 PM P8 (BP)
1:30 PM - 3:30 PM
Keywords:Single crystal Si, Point defect, Thermal stress