9:45 AM - 10:00 AM
[16a-413-4] Operand Analysis of Si-MOS Diode by Hard X-ray Photoelectron Spectroscopy -Evaluation of Potential Changes and Chemical Bonding Features-
Keywords:HAXPES
Oral presentation
13 Semiconductors » 13.3 Insulator technology
Thu. Mar 16, 2017 9:00 AM - 12:15 PM 413 (413)
Takanobu Watanabe(Waseda Univ.), Kiyoteru Kobayashi(Tokai Univ.)
9:45 AM - 10:00 AM
Keywords:HAXPES