The 64th JSAP Spring Meeting, 2017

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Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[16a-419-1~12] 6.3 Oxide electronics

Thu. Mar 16, 2017 9:00 AM - 12:15 PM 419 (419)

Yusuke Nishi(Kyoto Univ.)

9:30 AM - 9:45 AM

[16a-419-3] Formation Mechanism of Conducting Path in Resistive Random Access Memory ~ Verification of a grain surface tiling model ~

〇(B)Sohta Hida1, Takumi Moriyama1, Takahiro Yamasaki2, Takao Ohno2, Michiko Yoshitake2, Satoru Kishida1,3, Kentaro Kinoshita1,3 (1.Tottori Univ., 2.NIMS, 3.TiFREC)

Keywords:ReRAM, grain boundaries, Metal oxide