[16a-512-1~8] Imaging of interfaces in thin films and multilayers

[16a-512-8] [JSAP Young Scientist Award Speech] Structural Analysis of Micro-Phase Separated Monolayers using X-ray Reflectometry

〇Masumi Eda¹, Eri Nasuno¹, Norihiro Kato¹, Ken-ichi Iimura¹ (1.Utsunomiya Univ.)

Keywords:Langmuir-Blodgett film, micro-phase separation, X-ray reflectometry

We have founded that vertically-grown structures (VGS) of silica precursor with height of several tens of nanometers are formed site-selectively on two-dimensional template surfaces fabricated with micro-phase separated structures in mixed monolayers prepared by the Langmuir-Blodgett technique. In this study, X-ray reflectometry was applied to investigate the molecular packing structures in the phase-separated monolayers which determine the in-plane arrangement of VGS. It was suggested that film molecules in the mixed monolayers were phase-separated with the same orientation and density as those in their pure monolayers.