The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

13 Semiconductors » 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

[16a-E206-1~13] 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

Thu. Mar 16, 2017 9:00 AM - 12:15 PM E206 (E206)

Masato Sone(Titech), Masahide Goto(NHK)

9:45 AM - 10:00 AM

[16a-E206-4] Minimal CVD Process with Minimum Materials Consumption

Hitoshi Habuka1, Miya Matsuo1, Ayami Yamada1, Ning Li1, Takanori Mikahara2,3, Shin-ichi Ikeda2,3, Yuuki Ishida2,3, Shiro Hara2,3 (1.Yokohama Nat. Univ., 2.MINIMAL, 3.AIST)

Keywords:Minimal manufacturing, Chemical Vapor Deposition, Epitaxial reactor

Chemical Vapor Deposition (CVD) process and reactor for the Minimal Manufacturing was re-designed in order to achieve the minimal materials consumption. Its major issue is to use the natural convection which is spontaneously produced by the combination of small gas supply and the high temperature. By employing this concept, the gas flow rate can be shrunk from 1000 sccm to less than 50 sccm.