[16a-F201-1~12] 13.10 Compound solar cells

[16a-F201-12] Damp heat & PID testing of CIGS modules with forward bias: a new option for the IEC test standards

〇Keiichiro Sakurai¹, Kinichi Ogawa¹, Hajime Shibata¹, Atsushi Masuda¹, Hiroshi Tomita², Darshan Schmitz², Shuuji Tokuda² (1.AIST, 2.Solar Frontier)

Keywords:CIGS, damp heat, PID, voltage bias, IEC

Damp heat testing of CIGS modules, which have been usually done under dark heated state, sometimes causes Test-Specific Degradation(TSD), which is an artifitial degradation not observed in real fields. We have previously reported that this TSD can be supressed by appling voltage bias during the test. Based on our results, an voltage bias option was added to the IEC61215-1-4. PID tests, which also involve dark heated state, is now under considered for amendment. We report on the latest status of the amendment process.