The 64th JSAP Spring Meeting, 2017

Presentation information

Symposium (Oral)

Symposium » Recent GFIS microscopy technology and its future prospects for R & D of materials and devices

[16p-315-1~11] Recent GFIS microscopy technology and its future prospects for R & D of materials and devices

Thu. Mar 16, 2017 1:15 PM - 6:00 PM 315 (315)

Hiroshi Mizuta(JAIST), Shinichi Ogawa(AIST)

5:15 PM - 5:45 PM

[16p-315-10] Charge transport control in graphene by helium ion irradiation and patterning

Shu Nakaharai1 (1.NIMS)

Keywords:graphene, electric conductance, crystalline defect