[16p-424-1~8] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

[16p-424-6] Secondary Ion Measurements under Electrospray Droplet and Gas Cluster Bombardments

〇Satoshi Ninomiya¹, Mauo Sogou², Daisuke Sakai², Katsumi Watanabe², LeeChuin Chen¹, Kenzo Hiraoka³ (1.Univ. Yamanashi, 2.ULVAC-PHI, 3.Univ. Yamanashi CERC)

Keywords:Secondary ion mass spectrometry, Electrospray droplet, Gas cluster

In previous studies, we have developed a technique for electrospraying aqueous solutions in vacuum, which allows improving the performance as a practical cluster beam source for secondary ion mass spectrometry, and we have designed the prototype of a vacuum-type electrospray droplet ion (V-EDI) gun for surface analysis instruments. In this study, the secondary ions produced by the V-EDI and argon gas cluster ion beams were measured for several biomolecular samples with a time-of-flight secondary ion mass spectrometer.