3:30 PM - 3:45 PM
[16p-424-7] Improvement of a detection limit using tandem-SIMS instrument
Keywords:secondary ion mass spectrometry, tandem mass spectrometry, cluster ion beam
Oral presentation
CS Code-sharing session » CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication
Thu. Mar 16, 2017 2:00 PM - 4:00 PM 424 (424)
Noriaki Toyoda(Univ. of Hyogo)
3:30 PM - 3:45 PM
Keywords:secondary ion mass spectrometry, tandem mass spectrometry, cluster ion beam