SIMS Mesurement in Ambient Condition with Pipe-Nozzle

Presentation information

Oral presentation

CS Code-sharing session » CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

Thu. Mar 16, 2017 2:00 PM - 4:00 PM 424 (424)

Noriaki Toyoda(Univ. of Hyogo)

3:45 PM - 4:00 PM

〇(M1)Kenta Ishii¹, Toshio Seki¹, Takaaki Aoki¹, Jiro Matsuo¹ (1.Kyoto Univ.)

Keywords:Secondary Ion Mass Spectrometry