[16p-E206-1~17] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[16p-E206-9] Evaluation of Potential Distribution of Multiple Stacked Si Quantum Dots
by Hard X-ray Photoelectron Spectroscopy

〇Yuta Nakashima¹, Daichi Takeuchi^1,2, Katsunori Makihara¹, Akio Ohta¹, Mitsuhisa Ikeda¹, Seiichi Miyazaki¹ (1.Nagoya Univ., 2.JSPS Research Fellow)

Keywords:Si-QDs, electron emission