The 64th JSAP Spring Meeting, 2017

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Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[16p-E206-1~17] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Thu. Mar 16, 2017 1:45 PM - 6:30 PM E206 (E206)

Koichiro Saga(Sony), Nobuya Mori(Osaka Univ.), Takashi Hasunuma(Univ. of Tsukuba)

4:00 PM - 4:15 PM

[16p-E206-9] Evaluation of Potential Distribution of Multiple Stacked Si Quantum Dots
by Hard X-ray Photoelectron Spectroscopy

〇Yuta Nakashima1, Daichi Takeuchi1,2, Katsunori Makihara1, Akio Ohta1, Mitsuhisa Ikeda1, Seiichi Miyazaki1 (1.Nagoya Univ., 2.JSPS Research Fellow)

Keywords:Si-QDs, electron emission