The 64th JSAP Spring Meeting, 2017

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[16p-P4-1~8] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Thu. Mar 16, 2017 1:30 PM - 3:30 PM P4 (BP)

1:30 PM - 3:30 PM

[16p-P4-3] Movement of an Au nano-island formed on Mica using AFM

Takaaki Shima1, Tsuyoshi Hasegawa1 (1.Waseda Univ.)

Keywords:atomic force microcope, MICA (muscovite)

The forming of gold nano-islands, the movement of those, and fabricating wire structure using the contact mode of Atomic Force Microscope (AFM) on a Mica surface known as an insulating material is demonstrated. The manipulation of the nano-islands was performed using the cantilever of the AFM with contact mode. I confirmed the electric connection from external measuring instrument to those gold islands through the wiring structure of platinum by measurement of I/V characteristics.
We foresee that this technique is the new way of the forming wiring structure for the measurement of electrical characteristics at with some nano-scale structures fixing arbitrary position on surface.