The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

8 Plasma Electronics » 8.7 Plasma phenomena, emerging area of plasmas and their new applications

[17p-313-1~16] 8.7 Plasma phenomena, emerging area of plasmas and their new applications

Fri. Mar 17, 2017 12:45 PM - 5:00 PM 313 (313)

Satoshi Uchida(Tokyo Metropolitan Univ.), Akinori Oda(Chiba Inst. of Tech.)

12:45 PM - 1:00 PM

[17p-313-1] Low-Energy Mass-Selected Ion Beam Production of Fragments Produced from Hexamethyldisilane for SiC Film Formation

Satoru Yoshimura1, Satoshi Sugimoto1, Masato Kiuchi1,2 (1.Osaka Univ., 2.AIST)

Keywords:SiC, Hexamethyldisilane, fragment

Now, we are trying to deposit films on substrates by means of the irradiation of fragment ions produced through source gas decomposition. In this study, we have selected a silicon carbide (SiC) film deposition on Si substrate using hexamethyldisilane (HMD) as an experimental model. The successful epitaxial growth of SiC has been carried using silane, monomethylsilane (MMS), or dimethylsilane (DMS). Silane, MMS, or DMS are extremely flammable. On the contrary, hexamethyldisilane is relatively secure to handle, because it is less flammable than the above three gases. In this paper, we have confirmed that the mass-selected fragment ions obtained from HMD could be useful for the secure epitaxial growth of SiC.