Hidekazu Yamamoto

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Speaker, Author, Co-Author

Wed. Sep 19, 2018 9:00 AM - 12:00 PM 131 (131+132)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[19a-131-1~11] 15.7 Crystal characterization, impurities and crystal defects

10:00 AM - 10:15 AM

[19a-131-5] Evaluation of carrier density of GaN crystal using THz wave and Raman scattering spectroscopy

〇Hidekazu Yamamoto¹, Yuki Honma¹, Yuki Ogura¹, Seigo Ohno^2,3, Hiroaki Minamide², Hiromasa Ito² (1.Chiba Inst. of Tech., 2.RIKEN, 3.Tohoku Univ.)