Syun Ito

Speaker, Author, Co-Author

Tue. Sep 18, 2018 4:00 PM - 6:00 PM PA (Event Hall)

Poster presentation
| 13 Semiconductors
| 13.7 Compound and power electron devices and process technology

[18p-PA6-1~30] 13.7 Compound and power electron devices and process technology

4:00 PM - 6:00 PM

[18p-PA6-5] Comparison of traps in n-GaN grown by different VPE on GaN substrate

〇(M1)Syun Ito¹, Yutaka Tokuda¹, Tetsuo Narita², Taishi Kimura², Daisuke Nakamura², Kazuyoshi Tomita², Tetsu Kachi³ (1.Aichi Inst. of Technol, 2.Toyota Central R&D Labs., Inc., 3.Nagoya Univ.)

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