Atsushi Hiraiwa

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Speaker, Author, Co-Author

Wed. Sep 19, 2018 3:00 PM - 6:45 PM CE (Century Hall)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power electron devices and process technology

[19p-CE-5~17] 13.7 Compound and power electron devices and process technology

3:30 PM - 3:45 PM

[19p-CE-6] Advanced photo-assisted capacitance characterization of deep traps at insulator/wide-bandgap semiconductor interface

〇Atsushi Hiraiwa^1,4, Satoshi Okubo², Kiyotaka Horikawa², Hiroshi Kawarada^2,3 (1.RONLI, Waseda Univ., 2.Fac. Sci. Eng., Waseda Univ., 3.KMLMST, Waseda Univ., 4.IMaSS, Nagoya Univ.)

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