Tatsuhiko Nishimura

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Speaker, Author, Co-Author

Thu. Sep 20, 2018 9:00 AM - 12:30 PM 141 (141+142)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[20a-141-1~13] 15.6 Group IV Compound Semiconductors (SiC)

11:30 AM - 11:45 AM

[20a-141-10] Evaluation of SiO₂/SiC interface using a Laser Terahertz Emission Microscope

〇Tatsuhiko Nishimura¹, Hidetoshi Nakanishi¹, Iwao Kawayama², Masayoshi Tonouchi², Takuji Hosoi³, Takayoshi Shimura³, Heiji Watanabe³ (1.SCREEN, 2.ILE, Osaka Univ., 3.Graduate School of Eng., Osaka Univ.)