Yuuki Ogura

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Speaker, Author, Co-Author

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

Poster presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[20a-PA6-1~9] 15.7 Crystal characterization, impurities and crystal defects

9:30 AM - 11:30 AM

[20a-PA6-7] Evaluation of strained SiC wafer by Raman scattering spectroscopy

〇(M1)Yuuki Ogura¹, Shinsuke Sakai², Hidekazu Yamamoto¹ (1.Chiba Inst of Tech, 2.Success Ltd)