Marek Edward Schmidt

→ Search for Marek Edward Schmidt in Google Scholar

Speaker, Author, Co-Author

Thu. Sep 20, 2018 1:30 PM - 6:00 PM 233 (233)

Symposium (Oral)
| Symposium
| Advanced ion microscopy for future nanoelectronics materials and devices

[20p-233-1~10] Advanced ion microscopy for future nanoelectronics materials and devices

2:00 PM - 2:15 PM

▲ [20p-233-2] Nanopatterning by helium ion beam: Only as good as the sample

〇(PC)Marek Edward Schmidt¹, Ogawa Shinichi², Mizuta Hiroshi^1,3 (1.JAIST, 2.AIST, 3.Hitachi Cambridge)