Soma Nishibe

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Speaker, Author, Co-Author

Fri. Sep 21, 2018 9:30 AM - 11:30 AM PA (Event Hall)

Poster presentation
| 13 Semiconductors
| 13.8 Optical properties and light-emitting devices

[21a-PA3-1~20] 13.8 Optical properties and light-emitting devices

9:30 AM - 11:30 AM

[21a-PA3-16] Study on the precious measurement of the nonlinear refractive index in InP thick film using closed aperture Z-scan technique

〇(M2)Soma Nishibe¹, Isana Morita², Masaki Oishi¹, Toshio Matsusue¹, Hiroyuki Bando¹ (1.Chiba Univ., 2.Chiba Univ. Eng.)