Yuji Ino

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Speaker, Author, Co-Author

Fri. Sep 21, 2018 1:45 PM - 5:00 PM 133 (133+134)

Oral presentation
| 16 Amorphous and Microcrystalline Materials
| 16.3 Bulk, thin-film and other silicon-based solar cells

[21p-133-1~12] 16.3 Bulk, thin-film and other silicon-based solar cells

4:15 PM - 4:30 PM

[21p-133-10] Effect of the tabbing condition of interconnectors on the degradation by a high temperature and high humidity test for crystalline Si PV modules

〇Yuji Ino¹, Shuichi Asao¹, Katsuhiko Shirasawa¹, Hidetaka Takato¹ (1.FREA, AIST)