1:30 PM - 3:30 PM
[21p-PB1-18] XPS analysis of interface between metal and organic film by Ar gas ion cluster ion beam
〇Masashi Seki1, Kazuki Nakamura2, Sayaka Yamamoto2, Hiromi Tanaka2 (1.Toshiba TEC Corp., 2.National Institute of Technology, Yonago College)