1:30 PM - 3:30 PM [21p-PB6-4] A study of distribution of residual stress on n-type 4H-SiC in contact with an electrode by micro-Raman imaging and ab-initio calculations 〇Jun Suda1, Satoshi Suwa1, Kouki Togo1, Shugo Mizuno1 (1.Chukyo Univ.)