The 79th JSAP Autumn Meeting, 2018

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18a-143-1~9] 6.6 Probe Microscopy

Tue. Sep 18, 2018 9:30 AM - 11:45 AM 143 (143)

Toru Utsunomiya(Kyoto Univ.)

11:30 AM - 11:45 AM

[18a-143-9] Investigation of carrier dynamics in organic thin-film transistors by time-resolved Kelvin-probe force microscopy without voltage modulation (2)

〇Kouichi Innami1, Kei Kobayashi1, Hirofumi Yamada1 (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

Keywords:Kelvin-probe force microscopy, Time-resolved measurement