The tracking of charge in OFET by time-resolved force microscope

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Tue. Sep 18, 2018 1:45 PM - 5:45 PM 143 (143)

Takashi Ichii(Kyoto Univ.), Yoshiaki Sugimoto(Univ. of Tokyo)

3:15 PM - 3:30 PM

〇(M2)kentaro Kajimoto¹, Kento Araki¹, Yoichi Otsuka¹, Hiroshi Oyama¹, Takuya Matsumoto¹ (1.Osaka Univ.)

Keywords:time resolved Electrostatic Force Microscopy