Oral presentation

[18a-143-1~9] 6.6 Probe Microscopy

Tue. Sep 18, 2018 9:30 AM - 11:45 AM 143 (143)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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9:30 AM - 9:45 AM

[18a-143-1] Single cancer cell diagnosis with morphological and rheological parameters measured by atomic force microscopy

〇(D)Ryosuke Tanaka¹, Moe Nagase¹, Kaori Kuribayashi-Shigetomi¹, Agus Subagyo¹, Kazuhisa Sueoka¹, Takaharu Okajima¹ (1.Info. Sci. & Tech. Hokkaido Univ.)

9:45 AM - 10:00 AM

[18a-143-2] Feedback Control for Tapping Mode Scanning Probe Electrospray Ionization

〇Yoichi Otsuka¹, Bui Kamihoriuchi¹, Aya Takeuchi¹, Futoshi Iwata², Takuya Matsumoto¹ (1.Osaka Univ., 2.Shizuoka Univ.)

10:00 AM - 10:15 AM

[18a-143-3] High speed AFM observation of lipid degradation process on photocatalytic TiO₂ surface

〇Hayato Yamashita^1,2, Daiki Katsube¹, Masayuki Abe¹ (1.Grad. Sch. of Eng. Sci., Osaka Univ., 2.PRESTO,JST)

10:15 AM - 10:30 AM

[18a-143-4] Visualization of biotinylated DNA on streptavidin crystal using FM-AFM

〇Shogo Maeda¹, Hiroaki Kominami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

10:30 AM - 10:45 AM

[18a-143-5] Development of a fine material deposition technique using a scanning nanopipette probe microscope capable of irradiating localized atmospheric pressure plasma jet

〇Sho Yamamoto¹, Daisuke Morimatsu¹, Masaru Shimomura¹, Akihisa Ogino¹, Masaaki Nagatsu², Futoshi Iwata^1,2 (1.Graduate school of Engineering, Shizuoka Univ., 2.Research Institute of Electronics, Shizuoka Univ.)

10:45 AM - 11:00 AM

[18a-143-6] Fabrication of a micropillar based on deposition of Au colloidal nanoparticles using a scanning ion conductance microscope

〇Masayoshi Yoshioka¹, Futoshi Iwata^1,2 (1.Shizuoka Univ., 2.Research Institute of Electronics)

11:00 AM - 11:15 AM

[18a-143-7] Depth profiling of polystyrene nanoparticles buried in polymer matrix by scanning thermal noise microscopy

〇Hiroshi Tono¹, Kuniko Kimura¹, Kei Kobayashi¹, Hirohumi Yamada¹ (1.Kyoto Univ.)

11:15 AM - 11:30 AM

[18a-143-8] Measurement of carrier density distribution by dissipative force modulation scanning capacitance force microscopy

〇(DC)Takeshi Uruma¹, Nobuo Satoh², Hidekazu Yamamoto², Futoshi Iwata¹ (1.Graduate School of Sci. and Tech., Shizuoka Univ., 2.Chiba. Ins. of Tech.)

11:30 AM - 11:45 AM

[18a-143-9] Investigation of carrier dynamics in organic thin-film transistors by time-resolved Kelvin-probe force microscopy without voltage modulation (2)

〇Kouichi Innami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

Oral presentation

[18p-143-1~15] 6.6 Probe Microscopy

Tue. Sep 18, 2018 1:45 PM - 5:45 PM 143 (143)

Takashi Ichii(Kyoto Univ.), Yoshiaki Sugimoto(Univ. of Tokyo)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:45 PM - 2:00 PM

△ [18p-143-1] Atomic resolution structural analysis of KBr surface and adsorbed water molecules in humidity-controlled air

〇(PC)Hiroaki Ooe¹, Toyoko Arai¹ (1.Kanazawa Univ.)

2:00 PM - 2:15 PM

△ [18p-143-2] Structural Order of Liquid Ga and GaInSn alloy at the Interface Investigated by AFM

〇Makoto Murata¹, Takashi Ichii¹, Toru Utsunomiya¹, Hiroyuki Sugimura¹ (1.Kyoto Univ.)

2:15 PM - 2:30 PM

△ [18p-143-3] Automatic Processing of Force Curves by Machine Learning

〇ZHUO DIAO¹, Daiki Katsube¹, Masayuki Abe¹ (1.Osaka University)

2:30 PM - 2:45 PM

△ [18p-143-4] Simulation of Force Spectroscopy of Atomic-Scale Peeling of Graphene

〇Ryoji Okamoto¹, Naruo Sasaki¹ (1.The Univ. of Electro-Commun.)

2:45 PM - 3:00 PM

△ [18p-143-5] Luminescence of Thermally-reduced Graphene Oxide on a Self-assembled monolayer

〇Takumi Sasajima¹, Satoshi Katano¹, Ryuhei Kasama¹, Yoichi Uehara¹ (1.tohoku univ)

3:00 PM - 3:15 PM

△ [18p-143-6] Time-resolved electrostatic force microscopy using cantilever oscillation

〇(DC)Kento Araki¹, Yutaka Ie², Yoshio Aso², Hiroshi Ohoyama¹, Takuya Matsumoto¹ (1.Osaka Univ., 2.Osaka Univ. ISIR)

3:15 PM - 3:30 PM

△ [18p-143-7] The tracking of charge in OFET by time-resolved force microscope

〇(M2)kentaro Kajimoto¹, Kento Araki¹, Yoichi Otsuka¹, Hiroshi Oyama¹, Takuya Matsumoto¹ (1.Osaka Univ.)

3:45 PM - 4:00 PM

△ [18p-143-8] Variable frequency measurements of ∂ C/∂ V in electrostatic force microscopy with dual bias modulation

〇Ryota Fukuzawa¹, Takuji Takahashi^1,2 (1.IIS, The Univ. of Tokyo, 2.NanoQuine, The Univ. of Tokyo)

4:00 PM - 4:15 PM

△ [18p-143-9] Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy

〇Koki Takano¹, Kohei Yamasue¹, Yasuo Cho¹ (1.Tohoku Univ.)

4:15 PM - 4:30 PM

△ [18p-143-10] Fabrication of Cr tips with in-plane magnetization

〇Shin Takada¹, Keito Omi¹, Satoshi Hiura¹, Agus Subagyo², Eiji Hatta¹, Kazuhisa Sueoka¹ (1.Graduate School of IST,Hokkaido Univ., 2.CRIS,Hokkaido Univ.)

4:30 PM - 4:45 PM

△ [18p-143-11] Imaging of SrTiO₃(100) (√13×√13) R33.7° surface using non-contact atomic force microscopy

〇(DC)daiki katsube¹, Masayuki Abe¹ (1.Osaka Univ.)

4:45 PM - 5:00 PM

△ [18p-143-12] Imaging of structure transition from the (1×1) to the (1×2) of rutile TiO₂(110) surface

〇Shoki Ojima¹, Daiki Katsube¹, Yuji Miyato¹, Hayato Yamashita^1,2, Satoshi Abo¹, Masayuki Abe¹ (1.Osaka Univ., 2.JST PRESTO)

5:00 PM - 5:15 PM

△ [18p-143-13] Imaging of the Surface Potential on the Steps on Rutile TiO₂(110) using Kelvin Probe Force Microscopy

〇Masato Miyazaki¹, Huanfei Wen¹, Quanzhen Zhang¹, Yuuki Adachi¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

5:15 PM - 5:30 PM

△ [18p-143-14] Structure determination of silicene on Ag(111) surface √13x√13 R13.9° phase

〇Keisuke Yabuoshi¹, Lingyu Feng¹, Jo Onoda¹, Shota Fukuda², Taisuke Ozaki², Yoshiaki Sugimoto¹ (1.GSFS, Univ. of Tokyo, 2.ISSP, Univ. of Tokyo)

5:30 PM - 5:45 PM

△ [18p-143-15] NC-AFM observation of antiphase domains of Fe₃O₄ thin film surfaces

〇Seiichiro Ishikawa¹, Subagyo Agus², Hosoi Hirotaka², Hatta Eiji¹, Sueoka Kazuhisa¹ (1.Graduate School of IST, Hokkaido Univ., 2.CRIS, Hokkaido Univ.)

Oral presentation

[19a-143-1~8] 6.6 Probe Microscopy

Wed. Sep 19, 2018 9:30 AM - 11:45 AM 143 (143)

Masayuki Abe(阪大)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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9:30 AM - 10:00 AM

[19a-143-1] [JSAP Best Review Paper Award Speech] High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy

〇Yasuo Cho¹ (1.Tohoku Univ.)

10:00 AM - 10:15 AM

[19a-143-2] Measurements of element-specific signals by XANAM on a Ge surface

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

10:15 AM - 10:30 AM

[19a-143-3] Computer simulation for friction force microscopy

〇Yasuhiro Senda¹ (1.Yamaguchi Univ.)

10:30 AM - 10:45 AM

[19a-143-4] Development of ferromagnetic resonance probes for scanning probe microscope

〇(DC)Masahide Sugayama¹ (1.Graduate School of IST, Hokkaido Univ)

10:45 AM - 11:00 AM

[19a-143-5] Nanoscale study on adsorption structures of formic acid on Cu(111)

〇Akitoshi Shiotari¹, Yuichiro Shiozawa², Yoshiaki Sugimoto¹, Jun Yoshinobu² (1.GSFS, Univ. of Tokyo, 2.ISSP, Univ. of Tokyo)

11:00 AM - 11:15 AM

[19a-143-6] (16x2) Reconstruction on Si(110) Surface Studied by Atomic Force Microscopy

〇Tatsuya Yamamoto¹, Ryo Izumi¹, Katsuharu Matsumoto¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹, Kazushi Miki² (1.Osaka Univ., 2.Hyogo Univ.)

11:15 AM - 11:30 AM

[19a-143-7] Surface Resistance of Ge/Si(111)-(7×7) Evaluated by Joule Heat Energy Dissipation in Non-contact Atomic Force Microscopy

〇Daiki Kura¹, Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa Univ., 2.JAIST)

11:30 AM - 11:45 AM

[19a-143-8] Correlation between Electric Conductance and Mechanical Properties of Gold Point Contacts Analyzed Using Frequency Modulation Atomic Force Microscopy

〇Haruka Mitera¹, Taku Murakami¹, Ryota Hashimoto¹, Keisuke Ishizuka², Yoshihumi Oshima², Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa univ., 2.JAIST)

Poster presentation

[19p-PB3-1~14] 6.6 Probe Microscopy

Wed. Sep 19, 2018 1:30 PM - 3:30 PM PB (Shirotori Hall)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:30 PM - 3:30 PM

[19p-PB3-1] Study on the Casimir force measurement without the Contact potential difference

〇(DC)Naoki Yoshida^1,2, Kazuhisa Sueoka¹ (1.GSIST, Hokkaido Univ., 2.JSPS Research Fellow DC)

1:30 PM - 3:30 PM

[19p-PB3-2] Fabrication of thermal sensor for scanning probe microscope

〇Saori Tabuchi¹, Agus Subagyo^1,2, Yukari Koketsu¹, Eiji Hatta¹, Kazuhisa Sueoka¹ (1.Graduate School of IST, Hokkaido Univ, 2.CRIS, Hokkaido Univ.)

1:30 PM - 3:30 PM

[19p-PB3-3] Development of techniques combining 3DAP and STM

〇(M1)Takumi Umemura¹, Shu Kurokawa¹ (1.Kyoto Univ.)

1:30 PM - 3:30 PM

[19p-PB3-4] Development of time-resolved frequency-modulation atomic force microscopy for liquid environments

〇(M1)Naoto Fukazawa¹, Hiroaki Kominami¹, Kei Kobayashi¹, Yoshiki Hirata², Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng.,Kyoto Univ., 2.AIST)

1:30 PM - 3:30 PM

[19p-PB3-5] EC-FM-AFM analysis of Si electrode during lithiation/delithiation process in ionic liquid electrolyte

〇Kazuyuki Itakura¹, Takashi Ichii¹, Toru Utsunomiya¹, Hiroyuki Sugimura¹ (1.Kyoto Univ.)

1:30 PM - 3:30 PM

[19p-PB3-6] Two probe conductance measurement of monolayer/bilayer WSe₂ by using Multi-probe STM

〇Hiroyuki Mogi¹, Ibuki Kuroda¹, Yuhei Takaguchi², Shoji Yoshida¹, Yasumitsu Miyata², Osamu Takeuchi¹, Hidemi Shigekawa¹ (1.Univ. of Tsukuba, 2.Tokyo Metro. Univ.)

1:30 PM - 3:30 PM

[19p-PB3-7] Investigations of intramolecular structures of fullerene molecules by FM-AFM/KFM at room temperature (2)

〇Teruyuki Tanaka¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

1:30 PM - 3:30 PM

[19p-PB3-8] High resolution imaging of ice surfaces with atomic force microscopy

Naoya Kawakami¹, Akitoshi Shiotari¹, 〇Yoshiaki Sugimoto¹ (1.Univ. Tokyo)

1:30 PM - 3:30 PM

[19p-PB3-9] Measurement of Electronic Property of Borophene under Low Temperature

〇Isamu Shingu¹, Shinpei Hosokawa¹, Satoshi Endo¹, Hiroshi Tabata¹, Osamu Kubo¹, Mitsuhiro Katayama¹ (1.Osaka Univ.)

1:30 PM - 3:30 PM

[19p-PB3-10] Measurement of Resistance Change of Silver Sulfide Nanodots Caused by Silver Atoms' Precipitation

〇(M1)Nozomi Mishima¹, Takaaki Shima¹, Tsuyoshi Hasegawa¹ (1.Waseda Univ.)

1:30 PM - 3:30 PM

[19p-PB3-11] Estimation of a phase diagram from a single STM image

〇Shu Kurokawa¹, Shinya Tabata¹, Kazuhito Takeuchi¹, Koretaka Yuge¹ (1.Kyoto Univ.)

1:30 PM - 3:30 PM

[19p-PB3-12] A study of electron states of carbon layers on Fe₃O₄(001) surfaces

〇Keito Omi¹, Shin Takada¹, Satoshi Hiura¹, Agus Subagyo², Kazuhisa Sueoka¹ (1.GSIST,Hokkaido Univ., 2.CRIS,Hokkaido Univ.)

1:30 PM - 3:30 PM

[19p-PB3-13] Investigation of carrier dynamics in organic thin-film transistors by Kelvin-probe force microscopy for compared bottom contact type with top contact type

〇Masahiro Takeshita¹, Kouichi Innami¹, Tsutau Yokocho¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

1:30 PM - 3:30 PM

[19p-PB3-14] Investigation of Conformational Effect in Single Molecular Junction for Short-Distance Electrodes using Dynamic Probe Method

〇Atsushi Taninaka¹, Shoji Yoshida¹, Yoshihiro Sugita¹, Osamu Takeuchi¹, Hidemi Shigekawa¹ (1.Univ. of Tsukuba)

Sessions

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18a-143-1~9] 6.6 Probe Microscopy

[18p-143-1~15] 6.6 Probe Microscopy

△ [18p-143-1] Atomic resolution structural analysis of KBr surface and adsorbed water molecules in humidity-controlled air

△ [18p-143-2] Structural Order of Liquid Ga and GaInSn alloy at the Interface Investigated by AFM

△ [18p-143-3] Automatic Processing of Force Curves by Machine Learning

△ [18p-143-4] Simulation of Force Spectroscopy of Atomic-Scale Peeling of Graphene

△ [18p-143-5] Luminescence of Thermally-reduced Graphene Oxide on a Self-assembled monolayer

△ [18p-143-6] Time-resolved electrostatic force microscopy using cantilever oscillation

△ [18p-143-7] The tracking of charge in OFET by time-resolved force microscope

△ [18p-143-8] Variable frequency measurements of ∂ C/∂ V in electrostatic force microscopy with dual bias modulation

△ [18p-143-9] Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy

△ [18p-143-10] Fabrication of Cr tips with in-plane magnetization

△ [18p-143-11] Imaging of SrTiO3(100) (√13×√13) R33.7° surface using non-contact atomic force microscopy

△ [18p-143-12] Imaging of structure transition from the (1×1) to the (1×2) of rutile TiO2(110) surface

△ [18p-143-13] Imaging of the Surface Potential on the Steps on Rutile TiO2(110) using Kelvin Probe Force Microscopy

△ [18p-143-14] Structure determination of silicene on Ag(111) surface √13x√13 R13.9° phase

△ [18p-143-15] NC-AFM observation of antiphase domains of Fe3O4 thin film surfaces

[19a-143-1~8] 6.6 Probe Microscopy

[19p-PB3-1~14] 6.6 Probe Microscopy

Authentication

△ [18p-143-11] Imaging of SrTiO₃(100) (√13×√13) R33.7° surface using non-contact atomic force microscopy

△ [18p-143-12] Imaging of structure transition from the (1×1) to the (1×2) of rutile TiO₂(110) surface

△ [18p-143-13] Imaging of the Surface Potential on the Steps on Rutile TiO₂(110) using Kelvin Probe Force Microscopy

△ [18p-143-15] NC-AFM observation of antiphase domains of Fe₃O₄ thin film surfaces