The 79th JSAP Autumn Meeting, 2018

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Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[19a-143-1~8] 6.6 Probe Microscopy

Wed. Sep 19, 2018 9:30 AM - 11:45 AM 143 (143)

Masayuki Abe(阪大)

9:30 AM - 10:00 AM

[19a-143-1] [JSAP Best Review Paper Award Speech] High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy

〇Yasuo Cho1 (1.Tohoku Univ.)

Keywords:JSAP Best Review Paper Award Speech